Used OHKURA DP2301 #9210338 for sale
OHKURA DP2301 is a state of the art wafer testing and metrology equipment designed for production line wafer testing on various semiconductor substrates. DP2301 utilizes an optical metrology system that is capable of measuring topography, film thickness, critical dimensions, and other key parameters for production line control. OHKURA DP2301 is equipped with a patented multi-wavelength dark-field (MWDF) technique that provides a higher resolution than traditional single-wavelength dark-field inspection. This unit additionally provides an automated de-speck inspection function that can detect and set aside defective wafers. DP2301 also features a programmable stage that supports a wide range of anvils for accurate and reliable wafer transfers. This machine can measure several Key Performance Indicators (KPI) including: CD/width, pitch, and area. Additionally, OHKURA DP2301 comes equipped with a WDT (Wafer Die Tester) that can automatically check multiple wafers within the same batch for uniformity and wafer die defects. DP2301 comes with an intuitive user interface that integrates diagnostics, operation, and data processing. This tool is also capable of capturing images of wafers in real-time and providing statistical feedback on the quality of the wafers. Lastly, OHKURA DP2301 provides easy data analysis and provides an exportable report format of the measurement results. Overall, DP2301 is an excellent solution for wafer testing and metrology in production line settings. This asset is designed to be fast, accurate, and reliable and provides all the most-needed functions for production line monitoring. Additionally, this model is cost-effective and user-friendly, making it the perfect solution for wafer testing and metrology.
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