Used OHKURA DP2301 #9374939 for sale

OHKURA DP2301 is a wafer testing and metrology equipment. It is designed for measuring parameters of wafers such as film thickness, resistivity, and other electrical properties. The system utilizes a combination of testing methods such as profilometer measurements, impedance measurements, X-ray fluorescence analysis, and scanning electron microscopy. DP2301 is composed of high-precision modules that enable precise measurements. The wafer susceptor unit allows for flawless sample loading and unloading and ensures a precisely controlled thermal environment. The core of the machine is the test station that enables testing through Visual Basic programs that can be tailored to specific wafer parameters. The tool allows for a wide range of tests including current, voltage, capacitance, resistance, carrier mobility, current density, and sheet resistance measurement. Additionally, X-ray Fluorescence (XRF) and Scanning Electron Microscopy (SEM) can provide additional information about the samples. OHKURA DP2301 integrated wafer stage allows for analysis as well as uniform sample motion, and enables the measurement of multiple sample points simultaneously. In addition, the stage can be connected to a PC and controlled in real time, allowing for user-defined motion sequences. The asset also incorporates a built-in Multiple Sample Automatic Measurement (MASM) model. This equipment can capture up to 256 data points on a single wafer and store the data in its memory. This allows for rapid data collection from several wafer locations. Finally, DP2301 is designed to be both user-friendly and highly reliable. It has an easy-to-follow user interface and a comprehensive control panel that provides access to changing parameters quickly and easily. Additionally, its self-diagnosis and debugging system allows for the rapid identification of problems and errors, allowing for quick corrective action. In conclusion, OHKURA DP2301 unit is a reliable and versatile wafer testing and metrology machine. It is particularly well suited for measuring wafer parameters such as film thickness, resistivity, and other electrical properties. Its range of tests, multiple-sample automatic measurement tool, and user-friendly design makes it one of the best options currently on the market.