Used ONTO 9010TSA #293627643 for sale

ONTO 9010TSA
ID: 293627643
Optical review system Process: OCD.
ONTO 9010TSA is a state-of-the-art wafer testing and metrology equipment designed to provide reliable in-line wafer level metrology. The system utilizes a combination of highly advanced sensors and advanced vision-based image processing technology to acquire various non-contact measurements from the test wafer. The data from these measurements is then used to perform a variety of wafer level tests, including electrical resistance, thermal characteristics, layer thickness, contamination, surface shape, and so on. 9010TSA unit consists of a number of hardware components, including a specially designed wafer scanning base unit, a test chuck with a sophisticated gripper, a dedicated vision machine with multiple CCD cameras and various opto-electrical circuitry, and a number of conveyors and motion control systems. All of these components are designed to work together in order to accurately obtain the measurements and test results needed. The wafer scanning base unit is responsible for moving the wafer across the test chuck in order to obtain the necessary measurements. The test chuck is equipped with a number of custom sensors which capture the necessary data, while the vision tool acquires the necessary images during each scan. The opto-electrical circuitry is used to process the data and generate the desired test results. Once the data is gathered, it is then sent to the analysis computer, where the results are processed and analyzed. ONTO 9010TSA utilizes advanced algorithms to ensure that accurate and reliable data is obtained from each scan. The results can then be used for process control, trend analysis, and other predictive metrics. 9010TSA is a versatile and powerful wafer testing and metrology asset designed to provide reliable and accurate results. Thanks to its advanced sensing, processing, and analysis capabilities, it can quickly and accurately assess wafers and other materials at various stages of production, making it a great addition to any wafer testing and metrology program.
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