Used OPTEK 712VA #9359053 for sale

OPTEK 712VA is a wafer testing and metrology equipment designed to provide accurate, reliable, and repeatable measurements of physical and electrical parameters of wafers and other large scale materials. The system focuses on surface metrology, allowing users to measure a range of physical and electrical parameters of large-scale structures like wafers, substrates, and dies. 712VA utilizes multiple optical and scanning techniques to measure the physical and electrical characteristics of wafer surface. It uses a combined stylus profilometry and capacitance-based imaging unit to measure both electrical and physical parameters such as sheet resistance, roughness, uniformity, and texture. The machine features a Large Surface 3D Profiler (LS3D) and a Wafer Contact Profiler (WCP) which are both designed to map physical and electrical characteristics of wafer surfaces. The LS3D uses soft-contact stylus techniques to create a detailed 3D topographical map of the wafer surface, allowing users to quickly gain high accuracy, high repeatable measurements of the wafer. Furthermore, the WCP can measure average and minimum sheet resistance as well as texture parameters such as homogeneity, roughness, and surface uniformity. To ensure accuracy, OPTEK 712VA is equipped with a comprehensive software platform and a suite of automated calibration and calibration verification tools. The platform enables users to create wafer maps with high accuracy, allowing them to better characterize wafer surfaces. Additionally, the automated calibration and verification tools provide users with fast and reliable results in a variety of environments. Overall, 712VA provides users with reliable and repeatable measurements of physical and electrical characteristics of large-scale structures like wafers, substrates, and dies. The tool offers an all-in-one platform for surface metrology with an array of optical and scanning techniques and automated tools for verification. Its combination of accuracy, reliability, speed, and automation make it an ideal choice for a wide range of wafer testing and metrology applications.