Used ORC MEM-5296D #293642944 for sale

ORC MEM-5296D
ID: 293642944
Wafer Size: 8"
Vintage: 2002
Bump height measurement system, 8" 2002 vintage.
ORC MEM-5296D is a sophisticated wafer testing and metrology equipment designed for semiconductor manufacturers. It features integrated hardware, software and techniques for precise measurement of wafer characteristics. The system can measure wafer stress, surface texture and other microscopic patterns on a range of semiconductor materials. MEM-5296D is equipped with a high-resolution 5-axis stage and an automated measurement unit, making it ideal for high-precision analysis of critical parameters such as surface roughness, surface defect, and thickness variation. To ensure accurate data, the machine boasts a precision backlash-free drive, a rigid structure, and a long travel range for fast, accurate measurements. Additionally, a large area of measurement can be covered by scanning up to four wafers simultaneously. The tool is equipped with cutting-edge hardware and software to guarantee ultra-precise results. The advanced measurement optics offer high resolution imaging with a wide field of view, while the real-time image processing is designed to ensure accurate data. The automatic stage aids in controlling the sample position using a variety of motion parameters and allows for rapid accurate scanning. Moreover, ORC MEM-5296D is compatible with multiple interfaces, enabling seamless integration with existing metrology systems. The asset can be controlled via analog or digital inputs, and includes an Ethernet and USB interface for easy communication with measuring equipment. In addition, it is compliant with LabVIEW for automated data analysis and report generation. MEM-5296D is an ideal solution for demanding applications requiring fast and accurate total measurement capabilities. It can be used for a wide range of applications including surface characterization, defect detection, low-level stress determination, and contour mapping, among others. With its advanced software, precision optics, and efficient measurement model, it is the perfect choice for any semiconductor manufacturer in need of reliable, accurate wafer test and metrology solutions.
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