Used ORC MEM-5296D #293643637 for sale

ORC MEM-5296D is a state-of-the-art wafer testing and metrology equipment that by utilizing AFM (Atomic Force Microscopy) for direct surface wave measurement can provide highly precise surface data down to the nanometer level without the need of any lithography. MEM-5296D is designed to directly measure the wave forms of various types of wafers, and the AFM system allows for direct control of the wafer surface wave with a resolution level as low as 0.3nm. ORC MEM-5296D is capable of providing wave data across the full and entire surface of the wafer, with reliable wave and waveform reporting up to a 50μm scan area. The unit is equipped with 2D plane wave analysis capabilities, making it easy to analyze the wave characteristics of any waveform shape. MEM-5296D is also capable of auto correcting the sample, eliminating any distortion due to the machine hardware or environmental conditions. This automatic correction feature, known as the scan plane wave self-correction, provides stable and reliable results every time. The tool also provides data processing and waveform analysis functions through its integrated software, as well as graphical display of PE diagram and Angle Trace for waveform understanding. ORC MEM-5296D also has a touch screen user-friendly interface for easy data entry and display, with powerful software applications designed to streamline the total measurement and data analysis process. MEM-5296D is designed for use in semiconductor device production, quality evaluation and failure analysis for inspecting diffusion profile performance. It is capable of providing users with a highly precise 3-dimensional contour map of the surface profile of the wafers, making it an incredibly valuable tool for high-tech manufacturers. ORC MEM-5296D offers a variety of technology features such as automatic phase adjustment, auto-focusing asset, linear scan speed control, as well as software-controlled automation options, high-sensitivity scanning capabilities and GPIB/USB/RS-232 communication capability. With these features, MEM-5296D is an essential model for testing and measuring the properties of wafer surfaces.