Used PHASE SHIFT TECHNOLOGY OptiFlat #9244626 for sale

PHASE SHIFT TECHNOLOGY OptiFlat is an advanced, multi-dimensional, wafer testing and metrology equipment. It offers high-precision laser detection, nanometric-accurate scanning, and fast data processing capabilities. This technology utilizes phase-shift laser profiling to non-destructively measure topography and provide rich, reliable, and repeatable geometrical data for process control and yield improvement. OptiFlat system is equipped with a nanometer-scale displacement sensor and advanced image processing algorithms. This allows the systems to take accurate laser-profiles of wafer surfaces as well as to map fine, nanomorphic structures such as local hotspots or defects. It can map surface topology with nanometer accuracy, enabling precise data collection and analysis. PHASE SHIFT TECHNOLOGY reduces throughput time and increases inspection speed while producing highly precise and uniform results. It can also measure defects and hotspots across a wide range of materials, substrates, and sizes. With its high speed scanning capability, PHASE SHIFT TECHNOLOGY OptiFlat produces more detailed information than traditional non-contact measurements such as laser interferometry. OptiFlat also features a series of features to ensure data accuracy and expedite data processing. It has an automatic alignment unit for easy setup and calibration. Its data machine also features real-time analysis and reporting with automated tracing and data logging. PHASE SHIFT TECHNOLOGY OptiFlat tool is suitable for wafer testing and metrology tasks in the semiconductor industry. It can detect subtle changes in surface topology that may lead to yield defects. Its precision nanometer-scale measurement capabilities allow for proper evaluation of features such as thin-film processing defects, surface defects, and other surface features. It is a valuable tool for product evaluation, process development, and process control. With its high-precision laser detection, nanometric-accurate scanning, and fast data processing, OptiFlat asset is a powerful tool for wafer testing and metrology applications. It offers a reliable, repeatable, and accurate method to measure surface topology and defects at a high speed. This multi-dimensional model provides invaluable data for process control, yield improvement, and product evaluation.