Used PHILIPS Impulse 300B #9220307 for sale
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Wafer Size: 8"-12"
Automated laser based film measurement tool, 8”-12” (2) Cascade foup feeders for 8" / 12" (measures metal film thickness) 2004 vintage.
PHILIPS Impulse 300B is an advanced wafer testing and metrology equipment designed to provide accurate and reliable performance when testing and inspecting silicon-based semiconductor devices. It offers a variety of functions to facilitate accurate testing and measurement of device parameters, as well as fast and precise data acquisition and analysis. The system is built around a large, high-resolution imaging unit, allowing for accurate parameter measurements to be taken from different test sites on the wafer. Its high speed data acquisition module is capable of acquiring large amounts of data sets at rates of up to 10Khz, allowing for thorough testing of device parameters. The machine features a powerful Digital Signal processor (DSP) unit that offers a variety of functions for data analysis, allowing users to rapidly analyze complex test results. This DSP is also equipped with modern error correction technologies, enabling the tool to attain exceptional precision. Impulse 300B also comes with an advanced software tool that offer automation capabilities, allowing users to easily set up and configure the asset to run on multiple wafers. This allows for a more efficient testing process, streamlining production runs and greatly reducing turnaround times. Furthermore, the model also offers a comprehensive range of data compilation and report generation capabilities, allowing users to easily generate reports on the results of their tests. The equipment also has a variety of safety features, including shock-resistant encasing and dust-resistant enclosures to protect the system from contamination and any visible damage. Additionally, the unit also includes an array of safety interlocks that are designed to protect the users in case of any machine malfunctions. In summary, PHILIPS Impulse 300B is an advanced wafer testing and metrology tool that delivers high accuracy and reliability when it comes to testing and inspecting silicon-based semiconductor devices. By utilizing its powerful DSP, automation capabilities, and comprehensive report generation functions, this asset is an excellent choice for any user looking for an intuitive, user-friendly testing platform.
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