Used PHOSEON MX1001 #9226712 for sale

ID: 9226712
Wafer Size: 6"
Infrared Automated Optical Inspection (AOI) system, 6".
PHOSEON MX1001 is a wafer testing and metrology system designed to deliver reliable and accurate results quickly and efficiently. Employing direct imaging and laser displacement metrology technologies, MX1001 offers superior resolution and precision measurement capabilities. PHOSEON MX1001 features Optically Using Epitaxial Time-Gated Spectroscopy (OUETS), a technique that delivers real-time mapping of charge in III-V semiconductor wafers. The OUETS technology offers detailed local information related to charge, electron mobility, defect density, and electrical parameters of a wide range of substrates and chips. Combining this with laser displacement metrology, MX1001 provides high-speed imaging combined with high-precision measurements. The system also features a high-efficiency light source, providing diffuse uniform illumination on the wafer surface for enhanced measurement accuracy. PHOSEON MX1001 has an intuitive user interface, offering easy setup and operation, and is capable of highly automated measurements. To enable rapid and reliable analysis of die-level information, it is equipped with a powerful die separator as part of its integrated analysis package. In addition, MX1001 offers a complete range of powerful data analysis and reporting tools for quickly generating comprehensive reports. With its advanced imaging and measurement capabilities, PHOSEON MX1001 is a versatile wafer testing and metrology system ideal for a range of applications, including wafer calibration, wafer measurement, die evaluation and characterization, and self-test for electrical and resistive properties. It is available in both single and multiple tool configurations that can be tailored to meet the needs of any semiconductor production line, offering scalable performance for a variety of applications.
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