Used PHOSEON MX1002 #9226706 for sale

ID: 9226706
Wafer Size: 6"
Infrared Automated Optical Inspection (AOI) system, 6".
PHOSEON MX1002 is a high-end wafer testing and metrology equipment, made for the semiconductor industry. It is designed to measure the properties of substrates such as wafers, silicon chips, or other materials. This system has an advanced optical metrology head that uses laser interferometry and optical profiling for high-resolution imaging of substrates. It performs tests such as inter-layer metrology over a large area, film thickness measurements, and defect detection at high-magnification. The unit features a 7-axis kinematics design that allows for travels up to 2000mm in both the X- and Y-axes. This allows for a large measuring area. The optics head also offers a variable focal length with a maximum magnification of 250x, and an adjustable laser power up to 40mW. The optics machine itself is calibrated and constructed using high-precision alignment components. MX1002 is also equipped with a state-of-the-art sensor suite that includes a digital linear encoder for distance measurements, a 64-channel capacitance sensor for image analysis, and a temperature-compensated capacitance sensor. This sensor suite offers a wide range of measurements, from surface roughness to depth profiles. PHOSEON MX1002 also uses a powerful software suite that is designed to analyze the data collected from the sensors. This software includes advanced statistical analysis functions, along with powerful tools for post-processing of data. The software also includes a scan recorder feature, which can save data up to twenty times faster than standard rates. MX1002 is a powerful tool that is designed to meet the needs of the semiconductor industry. With its high-precision optics, complex sensor suite, and powerful software, it can be used to measure a variety of substrates accurately and quickly.
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