Used PHOTONICS FM-ARS 9000 #9083960 for sale
PHOTONICS FM-ARS 9000 is a state-of-the-art wafer testing and metrology equipment designed for semiconductor manufacturers and integrated circuit designers. It provides precise low-temperature wafer testing, metrology, and defect analysis capabilities at nanometer diameter scales. The system combines both quantum and traditional techniques allowing for higher performance. The unit utilizes a unique combination of spectroscopic and imaging techniques—including both macro- and micro-scale inspection—to comprehensively analyze wafers and integrated circuits. It is capable of detecting and correcting electrical, optical, and thermal performance characteristics, and features advanced defect analysis capabilities, allowing for the reliable identification of various defects during low-temperature testing. The machine is further enhanced by its advanced testing capabilities. It can accurately measure, compare, and analyze both delta-temperature and voltage values in the nanometer scale. This enables the rapid detection of performance-related defects, and can be used in combination with spectroscopic techniques to identify problems associated with optical reflections, dielectric layers, and VLSI devices. FM-ARS 9000 also offers a variety of advanced capabilities for the measurement of resistivity, capacitance, and other circuit characteristics. Its advanced metrology capabilities guarantee accurate resistivity positioning and uniformity of capacitance and inductance on a nanosecond timescale. The integrated circuit designers and manufacturers who use PHOTONICS FM-ARS 9000 report increased performance and reliability of their integrated circuits, resulting in decreased customer returns. This is due to its advanced defect detection capabilities, which have been demonstrated to save time and resources, eliminate unnecessary labor costs, and reduce the impact on the environment. Overall, FM-ARS 9000 is a highly advanced wafer testing and metrology tool designed to provide precise low-temperature wafer testing, metrology, and defect analysis capabilities at nanometer diameter scales. Its combination of spectroscopic and imaging techniques, advanced testing and metrology capabilities, and resistance and capacitance measurements make it the perfect tool for integrated circuit designers and manufacturers who need to meet their strict technological requirements.
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