Used PIMACS Neooptical 5600 #293651873 for sale

PIMACS Neooptical 5600 is a high performance wafer testing and metrology equipment designed specifically for the semiconductor industry. It provides high accuracy, repeatability, and speed for precise testing and measurements of wafer parameters. The system utilizes advanced scanning optics to enable precise measurements of both surface and subsurface features. Neooptical 5600 unit features two separate measurement modes; 2D/3D surface characterization mode and full-field inspection mode. The 2D/3D surface characterization mode offers high-speed, noncontact measurements of challenging wafer surfaces and 3D topographies, providing precise measurements of step heights, irregular shapes, and feature densities. The full-field inspection mode offers advanced contour mapping and defect detection capabilities, enabling the precise measurement and analysis of a wide range of wafer parameters, such as film and grain thickness, defects, and crystal orientation. The machine's optics provide high resolution imaging, with a maximum resolution of 0.4um for surface and subsurface measurements. This high-resolution imaging enables the precise measurement of complex surface and sub-surface features, allowing for the detailed inspection and analysis of complex geometries. The tool also features UV illumination, allowing users to capture images of highly reflective surfaces. This is ideal for inspecting surfaces with a wide range of characteristics, including reflective and non-reflective surfaces. Additionally, the asset features a built-in light source, enabling automated image acquisition, calibration, and analysis. PIMACS Neooptical 5600 also features advanced automation capabilities, allowing users to quickly set up and run multiple scans and tests in a single session. This helps to reduce the overall cost of testing, allowing users to perform several tests in sequence, without having to manually set up each test. Neooptical 5600 is a powerful, high performance wafer testing and metrology model that provides precise, repeatable, and accurate measurements. With its advanced scanning optics, advanced automation capabilities, and UV illumination, the equipment is ideal for precise testing and analysis of challenging surfaces and subsurface features.