Used PPI SYSTEMS INC FP-C2 #9249052 for sale

PPI SYSTEMS INC. PPI SYSTEMS INC FP-C2 is a wafer testing and metrology equipment designed for measuring critical electrical parameters of integrated circuits (ICs), such as current, voltage, and noise. As a non-destructive tester, FP-C2 is capable of testing an entire wafer and is equipped with an advanced software solution that enables analysis of results and immediate corrective actions to be taken. The system consists of a control station that runs the software, two or more probes for testing wafer sites, as well as up to 8 multiple configurations of tester cards that provide different electrical parameters. The probes are in-circuit testers that measure current/voltage, and they can be configured for both standard and low-voltage circuits. Additionally, the probes are equipped with data acquisition (DAQ) devices for high-precision analysis of the measurements. PPI SYSTEMS INC FP-C2 is capable of measuring up to 240 wafer sites simultaneously, providing fast and accurate testing for a variety of devices, including random access memory (RAM), logic, analog/power, bipolar, and microcontrollers. Furthermore, the unit contains an imaging machine that allows for the inspection of each wafer site. FP-C2 is packed with invaluable features for wafer testing and metrology. It includes specialized features for making precise and accurate readings and for automation, such as digital I/O, multiple test levels, programmable reference levels, differential switching, and adjustable timing. Additionally, the tool has a timer subroutine, which can be used to run multiple tests at the same time, and an onboard video camera asset for observing wafers to the micrometer level. PPI SYSTEMS INC FP-C2 is a powerful tool for any IC manufacturer looking for rapid and precise testing of high-volume wafers. It is designed to be both reliable and extremely user-friendly, allowing test engineers to bring the model up and running quickly. Additionally, the equipment is highly customizable and can be adapted to accommodate specific test requirements.