Used PSS AccuSizer 780 APS #9298953 for sale

PSS AccuSizer 780 APS is a wafer testing and metrology system designed for the accurate, high-throughput testing and metrology of Wafer Edge Profiling (WEP), wafer Flatness Measurement (FMM), and thin film layer non-uniformity measurements. Using PSS AccuSizer 780, users can quickly and accurately analyze a wafer's edge profile, determine the flatness of the wafer, and measure the non-uniformity of the thin film on the wafer. The result of the measurements is an accurate representation of the wafer's shape and thickness, which is helpful for scrutinizing and calibrating processes. AccuSizer 780 APS employs advanced scanning laser confocal microscopy and digital image processing technology to enable the high-precision measurements. The device is equipped with a 75mm optical detection range which covers a sample size of up to 4' wide. It also incorporates an extensive range of focus detection techniques, enabling precise measurements of wafer thickness from 0.2um to 30um. Additionally, PSS AccuSizer 780 APS has a scanning speed of 238.6mm/sec. AccuSizer 780 APS is a critical tool for any facility dealing with wafer testing and metrology. By utilizing its advanced imaging and confocal microscopy capabilities, users can guarantee accurate and reliable measurements. The device also comes with a user-friendly graphical user interface which makes setup and operation easy and efficient. The device's robust design and increased scanning speed further add to its overall efficiency and reliability. Furthermore, PSS AccuSizer 780 APS has a temperature-controlled environment which ensures wafer analysis and metrology measurements are conducted in an optimal environment. In summary, AccuSizer 780 APS is a state-of-the-art wafer testing and metrology system designed to enable the accurate and high-throughput measurement of wafer sizes and thin film non-uniformity. It is equipped with a wide range of focus detection techniques, an extensive detection range, and a fast scanning speed. It is a reliable and easy-to-operate system which makes it an important tool for any facility dealing with wafer production and metrology.