Used RAYTEX RXW-1226SFI #293591340 for sale

RAYTEX RXW-1226SFI is a wafer testing and metrology equipment designed for measuring a wide range of parameters including sheet resistance, sheet resistance uniformity, sheet thickness, PRAM, and stress. The system features a large 200mm x 200mm workpiece carrier that automatically calibrates to the workpiece surface, allowing for fully automated testing. Additionally, the unit offers programmable scan speed and acceleration, allowing the user to customize testing parameters based on the specific application. The unit includes a 12.3 MP stereo optical microscope with a zoom of 150 to 500x, small tilt angles adjustment range, and automated focus adjustment. It is also capable of executing SEM leakage measurements, allowing for detailed analysis of microstructures and defects. The microscope also includes a self-contained wafer chuck and XY stages, allowing for precise measurements in two axes with resolution of 0.1um/step. RAYTEX RXW 1226SFI also comes equipped with a vacuum wafer evaporator, enabling the direct transfer of wafers from the sample carrier onto the microscope. This feature allows for quick loading and unloading of workpieces, greatly reducing setup time and labor. The unit is compatible with a wide range of materials, enabling the use of both organic and inorganic films during testing. RXW-1226SFI is ideal for applications that require precise measurements of microstructures and defects on a variety of substrates. Its intuitive interface and automated calibration allow for easy operation and rapid testing, while its 500x optical microscope and SEM leakage analysis capability enable detailed analysis of samples. The machine's vacuum wafer evaporator also allows for quick loading and unloading, enabling rapid testing and reducing setup time.