Used REHDER ET-3 #293659467 for sale

REHDER ET-3 is a wafer testing and metrology system that provides powerful, accurate and reliable results for qualitative and quantitative analysis of wafers. Utilizing a beam emission technique, ET-3 has the ability to measure and detect the condition of wafers such as chemical contaminants, deposition thickness, variation of oxide layers, and dimensional tolerances in both 2D and 3D. REHDER ET-3 is capable of retrieving data from multiple wafers simultaneously. With a scan speed of up to 11,000 wafer features per second, the system allows users to analyze and compare the properties of up to three wafer surfaces simultaneously. With its 3D rendering capability, ET-3 can accurately detect and measure wafer features in all directions. This allows for the proper analysis of step structure of wafers up to 30 microns thick. REHDER ET-3 is designed to be user friendly and comes with a clear graphical user interface for ease of operation. It also has a library of applications that make it easier to set up and perform wafer tests quickly and reliably. With its built in optimization options, ET-3 can perform complex analysis and display the results in a comprehensive graphical report. REHDER ET-3 is designed for use in production-level testing and inspection of wafers and components. It is capable of performing a wide range of tests and inspections including stud scanning, pattern detection, 2D profile measurements, and 3D evaluation of surfaces and edge profile. The system is also capable of providing real-time data that could be used for feedback control for process optimization. ET-3 is also designed to be easily integrated into existing wafer processing lines. With its ability to directly interface with other machines, it is capable of performing automated measurements as part of a larger production line. This allows for increased accuracy and efficiency in wafer testing and metrology. Overall, REHDER ET-3 is a powerful and reliable device that provides accurate and reliable results for wafer testing and metrology. With its advanced capabilities and integrated features, it has the potential to help streamline the quality control process and optimize production lines.