Used RUDOLPH / AUGUST 3Di 8500 #9283331 for sale

RUDOLPH / AUGUST 3Di 8500 is a wafer testing and metrology equipment designed to provide fast, accurate and reliable results in an efficient manner. This system offers a wide range of wafer inspection and characterization capabilities that provide a complete overview of the die surface features and defect characteristics. The unit is constructed on a compact, easily manually operated platform that offers an easy-to-use interface for a variety of tests. It features advanced optical technology with high-resolution imaging and automated image capture, as well as 3-D compensation capabilities for precision alignment and accurate metrology. With AUGUST 3Di 8500, the user can optimize inspection parameters for the analysis of wafers of different sizes and shapes, such as flat square wafers, curved, crescent, and tapered wafers. The advanced optics provide higher quality images that show customized features, allowing users to accurately evaluate and classify wafer defects. The machine is also compatible with many surface defects such as nodules, hillocks, stains, particles, wrinkles and pits. RUDOLPH 3Di 8500 also provides excellent 3-D capability to measure spacer heights and widths. Additional features of this tool include its ability to measure both roughness and sidewall angles to esbalish quality control, as well as analysis of epitaxy and isolation structures in order to assess thickness, width, and uniformity. The asset also offers high precision metrology and a low magnification imaging mode for precise inspection of features down to 0.6 µm. 3Di 8500 is the perfect choice for industry and educational facilities that are looking for a reliable wafer testing and metrology model. It offers advanced optical technology and automated image capture, as well as the ability to evaluate and classify wafer defects with an easy to use interface. The equipment is user-friendly and offers high-precision metrology capabilities, enabling accurate and reliable wafer inspection and characterisation.