Used RUDOLPH / AUGUST S3000SX #9305282 for sale

ID: 9305282
Thin film measurement system, 12" 2011 vintage.
RUDOLPH / AUGUST S3000SX is a wafer testing and metrology equipment that offers advanced wafer metrology capabilities. It is designed to provide precise measurements of upto 300mm wafers. It features an integrated wafer stage with an automated vacuum-sealer system for improved wafer-handling and positioning. AUGUST S3000SX comes equipped with a high-precision laser unit with automated beam alignment and real-time imaging for accurate and repeatable measurements. This machine utilizes advanced optoelectronic measurement techniques for higher resolution and accuracy while achieving cost effective throughput. It is equipped with multiple optical subsystems, laser diodes, and a high numerical aperture for high-speed measurements and greater flexibility. RUDOLPH S3000SX is capable of performing various measurements including line width, step height, overhang, and defect profile. The tool allows simultaneous acquisition of two inspection parameters at once. Advanced optoelectronic measurements are performed with low noise levels and high resolution. It also offers the ability to detect small faults on the wafer from as little as 20nm resolution. S3000SX also offers a wide range of specialized products versatile for various inspection and measuring needs. The asset can be customized for a variety of testing and metrology purposes. In addition to the standard wafer test and analysis process, the unit offers specialized products such as edge inspection, corner inspection, and image analysis, enabling the user to acquire detailed information about the wafer surface. The model also comes with CCD cameras used for the inspection and measurement of wafer features. The cameras feature high resolution and are able to capture information in high-definition detail. The unit also comes with a Large Field of View (LFOV) and Advanced Focus Control (AFC) for fast and accurate measurements. RUDOLPH / AUGUST S3000SX is also equipped with a calibrator for quickly and accurately setting up the equipment for each wafer. The system also offers the ability to store scan results for analysis, as well as store an extensive range of data for quality assurance monitoring. Overall, AUGUST S3000SX is a highly advanced wafer testing and metrology unit, offering precise measurements, high speed measurements, and powerful optoelectronic capabilities. With the ability to customize the machine and perform specialized measurements, this tool is ideal for those looking for accurate, efficient, and cost-effective wafer testing and metrology capabilities.
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