Used RUDOLPH AVP / Autopol V Polarimeter #9164947 for sale

RUDOLPH AVP / Autopol V Polarimeter is a high-performance wafer testing and metrology equipment that enables precise thickness computations with nanometer-level accuracy. The system is based on a vertical-transmission design, employing advanced optical interference measurement techniques to measure both the thickness and the refractive index of the samples. It uses two laser sources which allow it to measure a range of thickness from approximately 1 nm to 600 μm with nanometer-level resolution over a wide range of materials. The polarization of the incident light is filtered by an A-polarizer which is placed in front of the sample, allowing the unit to measure the changes in the angle of light as a function of the refractive index of the material being studied. This allows the user to accurately calculate the thickness of the sample, as well as the refractive index of the material. The optical configuration consists of two laser sources, a photodetector, and a polarizing beam splitter. The two laser sources measure one sample simultaneously, enabling the operator to obtain a reliable thickness measurement. The detected signals are passed through a linearized detector response correction module in order to correct for the non-linear detector response. The corrected signal is then digitized and fed to a high-performance numerical processor which is used to calculate the thickness and refractive index of the material. Additionally, AVP / Autopol V Polarimeter has an automated calibration process, ensuring reliable results with each sample measurement. The Autopol V is equipped with several unique features which make it especially advantageous for wafer testing and metrology applications. It is designed to be easily integrated into a wide range of production processes and manufacturing setups. The machine is also equipped with several automation features such as automatic position detection, automatic focus adjustment, and automatic transport of samples. Additionally, the integrated error control and compensation systems are designed to ensure the highest levels of accuracy and reliability. Overall, RUDOLPH AVP / Autopol V Polarimeter is a reliable and accurate wafer testing and metrology tool that offers unsurpassed performance and accuracy. Its advanced features make it one of the most advanced systems of its kind on the market, making it an ideal choice for wafer testing and metrology applications.