Used RUDOLPH MetaPulse 200 #293664997 for sale
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RUDOLPH MetaPulse 200 is a wafer testing and metrology equipment designed to process a variety of substrates and metrology materials. The system is equipped with a wide range of highly precise scanning and imaging technologies to allow users to tailor their processes to meet specific requirements. RUDOLPH META PULSE 200 provides precise patterning and testing capabilities, enabling users to analyze numerous wafer materials for a variety of applications. MetaPulse 200 features an integrated wafer-level metrology unit with a high-resolution stepper and interferometer. It is capable of scanning wafer surfaces up to 8-inches in size and can accurately measure dimensions as small as 1 micron. The stepper is able to control its speed and position in the X,Y, and θ axis to allow for custom pattern and alignment processes. Additionally, the machine's interferometer provides accurate measurements of surface topography to assess surface finish quality. META PULSE 200 is equipped with an automated measurement tool which allows users to collect precise data with minimal manual effort. It can perform non-contact wafer metrology via optical triangulation and confocal imaging. An automated alignment module and software make it easy to accurately align the interferometer to the wafer's surface. RUDOLPH MetaPulse 200 is designed to meet multiple testing and metrology requirements. It can perform a range of tests such as wafer patterning, surface roughness, size and shape, and geometry measurements. Additionally, the asset offers fast and precise data acquisition and manipulation capabilities, enabling users to quickly analyze and interpret test results for improved production and quality control. RUDOLPH META PULSE 200 is a reliable and versatile tool suited for the testing of large-scale substrates. In addition to its precision measurements, the model is designed to provide a safe and efficient working environment. It is fitted with a re-circulation air-conditioning equipment to ensure temperature and humidity levels within the chamber are kept constant for optimal performance. Its integrated software can monitor, analyze, log, and store metrology data, providing users with access to detailed processing and quality reports.
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