Used RUDOLPH MetaPulse 200 #9236527 for sale

ID: 9236527
Wafer Size: 8"
Vintage: 1999
Thickness measurement systems, 8" 1998 vintage.
RUDOLPH MetaPulse 200 is a state-of-the-art wafer testing and metrology equipment designed for highly accurate non-destructive measurements of wafer features and patterns. It is one of the most versatile systems available, offering a variety of tools to measure wafer characteristics and test results. RUDOLPH META PULSE 200 employs an automated non-contact optical microscope to conduct inspections, measurements and analysis. It utilizes a non-contact laser and camera combination to image the entire wafer surface, enabling precise alignment and high-resolution imaging of the test subjects. The system can also be equipped with magnification options, which can increase the resolution and accuracy of the measurement up to 250x. Additionally, the unit comes with a variety of software packages for wafer metrology, wafer characterization, and failure analysis. MetaPulse 200 offers high precision and repeatability with both particle level and wafer level metrology. It is equipped with advanced edge detection, defect inspection, and pattern recognition algorithms, to enable accurate measurements of thin lines, circles, and curves, as well as fabrics and particles, in both metal and silicon wafers. The machine enables customers to easily monitor, analyze, and act upon production data, with features such as report generation, data sharing and data analysis tools. In addition, a variety of tools are available for testing, verifying, and characterizing the wafers during fabrication, such as wafer cleaning, surface visual inspection, and contact angle testing. META PULSE 200 is ideal for industrial applications such as flat panel displays, medical devices and semiconductor packaging. It is designed to meet the demands of various production environments, and it is designed to withstand harsh conditions such as extreme temperatures, high humidity levels and dust aerosols. Furthermore, RUDOLPH MetaPulse 200 also has a variety of automation options, enabling customers to set up and run processes with ease. Overall, RUDOLPH META PULSE 200 is an advanced wafer testing and metrology tool that combines unparalleled accuracy with superior flexibility and automation. It provides an efficient and reliable toolset for wafer metrology, wafer characterization and failure analysis, enabling customers to analyze, access and act upon production data quickly and effectively.
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