Used RUDOLPH MetaPulse 200 #9300362 for sale

RUDOLPH MetaPulse 200 is a modern wafer testing and metrology equipment specifically designed for precision lithography processing in semiconductor manufacturing. This system provides users with high-accuracy dimensional measurements required for advanced high-performance components, as well as the ability to measure tiny features on the wafer surface. The core technology of RUDOLPH META PULSE 200 consists of a series of cameras and a reflector mounted on a special designed arm. This arm houses a grid for rapid sampling of the wafer, while the cameras allow for automatic alignment to the test samples. The grid also enables MetaPulse 200 to measure size, position, and shape of features on the wafer surface. The reflector captures the scattered light from the wafer and is combined with a CMOS imaging sensor to provide accurate dimensional measurements with sub-micron precision. META PULSE 200 enables the effective, rapid, and accurate measurement of features on the wafer surface; including line/space, bridge/gate, and via hole regions, as well as special features such as trenching steps. RUDOLPH MetaPulse 200 also provides users with a wide range of sample types compatible for measurement including wafers made from silicon, low-k and high-k dielectrics, fine and thick film dielectrics, copper, gold and titanium, as well as low temperature poly-silicon. RUDOLPH META PULSE 200 is a highly automated wafer testing and metrology unit that allows users to increase their productivity on the wafer frontend. It features advanced computer vision algorithms and motion control resolution to accurately measure the size and shape of features on the wafer surface. Additionally, MetaPulse 200 is equipped with advanced data-analysis software that helps users interpret and analyze test results. This ensures that the components produced meet the specified yield and performance requirements, while providing users with real-time feedback. META PULSE 200 is a state-of-the-art wafer testing and metrology machine that helps users produce high-performance and high-yielding components. It offers sub-micron accuracy, a wide range of sample types, and advanced computer vision and motion control capabilities, while providing users with reliable, real-time test results.