Used RUDOLPH MetaPulse 200 #9300363 for sale

RUDOLPH MetaPulse 200 is a wafer testing and metrology equipment designed for characterization and testing activities of integrated circuits (ICs) at the wafer level. It is ideal for analyzing, detecting, and measuring various electrical characteristics of the ICs. RUDOLPH META PULSE 200 is capable of providing fast and reliable results with high precision, enabling users to uncover and identify problems and potential yield-inhibiting defects in their ICs. The system includes a high-resolution 4-axis stage for quick and accurate motion control, a dedicated beam alignment module, a high-intensity pulsed laser source, and an impressive array of optional accessories. It also features an innovative imaging and mapping module that includes a 500 mm optical zoom that allows for better surface illumination and a 1200-pixel high-definition imaging unit that enables users to accurately inspect fine details. The tightly integrated hardware and software components of the machine ensures consistent and accurate testing results. The tool's short pulsewidth laser source is designed to provide repeatable and precise laser spot positioning with minimal damage to the ICs being tested. Furthermore, the powerful motor control module and laser power control allow users to accurately test ICs even when dealing with extremely small die sizes and complex, multi-layer configurations. The asset also comes with comprehensive software, that assists users to accurately test ICs quickly and reliably. This software provides users with on-the-fly analysis systems, which include automated scanning, analysis, and reporting features that significantly reduce testing times. It also features visualization and detection of faulty circuits, which allows for fast isolation and repair of any detected issues. The model provides users with complete data traceability, allowing them to store automatically generated inspection results for future reference. Furthermore, the equipment's user-friendly interface enables users to quickly launch tests, view results and create comprehensive reports with minimum effort. MetaPulse 200 is an ideal wafer testing and metrology system for cost effective IC characterization and testing. its innovative hardware components, complete software package and advanced features allow users to test ICs quickly and accurately, ensuring that any faults and defective ICs are quickly isolated and repaired.