Used RUDOLPH MetaPulse 200 #9302044 for sale

RUDOLPH MetaPulse 200 is an automated metrology and wafer testing equipment designed to provide accurate and reliable measurement of semiconductor wafer surfaces. The system provides visualization of data and high-precision non-destructive measurement. RUDOLPH META PULSE 200 is a self-contained unit featuring an integrated optical machine and CCD camera, and sensors for a variety of measurement tasks. The tool has a wide operating range, with the ability to measure surfaces at up to 65kHz and accurately to a resolution of 0.25 microns. It also supports dynamic measurement with low-noise and high-resolution. The asset offers a variety of features, including advanced pattern recognition algorithms, automated high-speed sampling, and user-defined error correction. It is capable of 3D measurement and analysis of image data, and features built-in image processing capabilities. The model also provides full-color image processing functions and a range of data analysis tools. MetaPulse 200 is designed to enable automated production line testing and measurement. It is capable of processing wafers quickly and accurately, even with variable loads and temperatures. The equipment also features automated file transfer and data archiving, allowing users to easily access and review measurement data. In addition, META PULSE 200 is equipped with a comprehensive library of standard wafer measurements and data analysis tools, allowing users to customize settings and parameters according to their specific test requirements. It also provides real-time data access and reporting, enabling users to quickly and accurately monitor the quality of their semiconductor wafer products. A customizable user interface allows for easy navigation, and the system supports a range of communication protocols, including Ethernet and Wi-Fi. A remote diagnostics feature is also included, allowing for unit troubleshooting from any location. Overall, RUDOLPH MetaPulse 200 provides a comprehensive automated metrology and wafer testing solution, with a range of features and capabilities. With its ability to process data quickly and accurately, it is an ideal machine for semiconductor manufacturers looking to monitor and review the quality of their products.