Used RUDOLPH MetaPulse 300 #9229638 for sale

RUDOLPH MetaPulse 300 is a state-of-the-art wafer testing and metrology equipment specifically designed for semiconductor fabrication. The system is capable of testing a variety of semiconductor wafer sizes ranging from 2 inches to 8 inches and provides an automatic three-dimensional scan of the wafer surface. The Acoustic Micro Imaging (AMI) imaging chip, first developed by RUDOLPH Technologies, is equipped inside the unit to provide the highest-resolution cross-sectional imaging to enable comprehensive analysis. The machine has the capability to detect voids, bumps, cracks, bumps, delamination, and other topological features of a wafer. MetaPulse 300 utilizes a unique four-axis motion tool for precise and efficient functioning. The combination of multidirectional, simultaneous movement of the wafer and the X-Y-Z operation positioning asset allows for fast motion along the specimen's entire examination zone. Furthermore, the model's speed control capabilities reduce abrupt motion that can potentially cause damage to the sample. Moreover, the equipment is outfitted with a variable laser beam spot size that ranges from 200 to 500 microns and is powered by a 940 nm laser diode. This adjustable spot size allows for more accurate control and the laser diode provides an optimal laser performance. In addition, an Electro-Optical Generator is used for instantaneous four-channel signal generation and dynamic gain control over the entire range of frequencies. This generator also has flexibility to add multiple channels for improved accuracy. The system is also equipped with a stainless-steel enclosure for improved operator safety. Finally, the unit has an ergonomic design, making it easy to operate. The machine is also resistant to shock, vibration, and other environmental hazards that are common in wafer production. This robust construction ensures reliable and accurate data output even during long operating hours. All in all, RUDOLPH MetaPulse 300 is a versatile wafer testing and metrology tool that can handle a variety of tasks with precision. It is equipped with all the necessary features and functions to make the metrology process more accurate and time-efficient. With its superior scan capabilities, robust construction, and efficient design, MetaPulse 300 is the ideal solution for semiconductor fabrication.