Used RUDOLPH MetaPulse 300 #9365999 for sale
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ID: 9365999
Wafer Size: 12"
Vintage: 2007
Thickness measurement system, 12"
With dual FOUP load ports
Open cassettes for handling, 8"-12"
Dual front opening unified pod loaders: 13/15 Slots for handling, 12"
Ultrafast laser output: 300 mW at 800 nm
Diode pump power: 2 W
Laser light source damaged
Missing parts:
Mainframe
EFEM Module
Chiller and inverter
2007 vintage.
RUDOLPH MetaPulse 300 is a state-of-the-art wafer testing and metrology platform designed to provide fast and precise wafer measurements before and during the semiconductor manufacturing process. The equipment features a number of advanced features and technologies that enable it to accurately measure and analyze the electrical characteristics of wafer dielectrics, metals, and other materials. At its core, MetaPulse 300 leverages three time-domain reflectometry channels to measure material properties and test the integrity of the wafer itself. The system combines these channels with advanced pulse width modulation technology to accurately analyze and measure materials up to 8400 MHz. Moreover, the unit can measure and identify a wide range of parameters, including resistance, capacitance, impedance, and dielectric strength of materials. The machine's user controls and interface are designed to be user-friendly and easy to understand. The large color touchscreen display helps guide users through tests and measurements while providing valuable feedback in the form of graphs, test data, and other real-time visualizations. Additionally, the tool integrates quickly and seamlessly with existing test and metrology equipment such as station control systems, allowing for smooth and efficient automation of test setups. RUDOLPH MetaPulse 300 also supports a range of test conditions and temperature ranges from -40°C to 150°C, so it can be used for high-temperature applications. Furthermore, the asset detects and measures a wide range of voltage levels and frequencies, up to 500 MHz, and features excellent noise reduction capabilities, enabling it to support high-accuracy tests. The platform also features a robust test bed environment with embedded quality assurance features designed to guarantee repeatable and reliable outcomes. Overall, MetaPulse 300 is an advanced wafer testing and metrology model that can provide powerful insight into the electrical properties of semiconductor materials. With its multiple channel reflectometry and independent test platform, the equipment is capable of accurately measuring a huge range of material parameters, making it an invaluable tool in any production environment.
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