Used RUDOLPH Metapulse #9244787 for sale

RUDOLPH Metapulse is a state-of-the-art wafer testing and metrology equipment, ideal for semiconductor manufacturers and research organizations looking for an efficient way to test and analyze wafer samples. This system is designed for accuracy, with reliable metrology results and over 6,000 achievable parameter readings. RUDOLPH META PULSE uses non-contact scanning acoustic microscopy (NSAM) and non-contact structured light imaging (SLI) technologies to provide accurate results with high resolution. Each unit is equipped with high-quality sensors and an advanced laser machine, enabling automated wafer testing and measurement in a variety of wavelengths. The metrology tools are designed to easily adapt and measure a wide range of wafer materials accurately and quickly. Advanced algorithms allow the tool to accurately predict wafer surface stresses and calculates defect depth, helping to speed up measurement times and provide more precise results. Further, Metapulse provides users with a wealth of data, which are collected and stored as the asset works. This data can then be included with a test report, so that the customer can easily see information such as wafer flatness, wafer topography, as well as scanned images and other physical features. Additionally, the model features an intuitive user interface that allows users to quickly set up and operate the equipment, making it perfect for users of all experience levels. META PULSE also offers a range of interface options, so users can choose to view the wafer images either online or offline, or both. And, with multiple languages supported, RUDOLPH Metapulse can be used in any environment. In summary, RUDOLPH META PULSE is a high performance wafer testing and metrology system that can provide accurate results with high resolution. It is designed to quickly and easily analyse a variety of wafer materials, helping manufacturers and research organizations get the most accurate and efficient wafer testing results.