Used RUDOLPH MP 200 #9238325 for sale

RUDOLPH MP 200 is a professional-grade wafer testing and metrology system designed to be a vital part of any semiconductor fabrication facility. It is designed to provide unparalleled accuracy and traceability and has been developed specifically to facilitate the testing of wafers for small pitch and high aspect ratio features. The system features an industry-leading, highly sensitive optical profilometer, which uses white light interferometry to scan the surface of the wafer. This measure the shape and contour of the features, as well as their relative position and size. It is also used to inspect mechanical and surface homogeneity on a microscopic level. The sensor's output is then sent to a powerful and versatile software package that incorporates several advanced algorithms to automatically identify and measure features as small as 1 nanometer. MP 200 also includes a revolutionary "stand alone" scatterometer, which is designed to detect automated graphical images on the surface of the wafer and measure their size and shape. This tool can be used to perform a more detailed inspection of the wafer's surface and is especially helpful in inspecting features such as smaller area devices or high-resolution patterns. Finally, RUDOLPH MP 200 also has a multi-sensor, fully automated process control system designed to accurately monitor and control all of the processes that can affect the quality of a wafer. This includes the temperature, pressure, and photon and electron beam exposure during processing. Overall, MP 200 is an invaluable tool for any semiconductor fabrication facility, offering an unprecedented level of accuracy and traceability when testing and measuring wafers. It is highly versatile in its ability to inspect graphical images, detect features as small as 1 nanometer, and accurately monitor and control the process during processing. With its multiple sensors and powerful yet user-friendly software package, RUDOLPH MP 200 is a reliable and effective solution for wafer testing and metrology.