Used RUDOLPH MP 300 #293761406 for sale

RUDOLPH MP 300
ID: 293761406
Wafer Size: 12"
Metal film thickness measurement system, 12".
RUDOLPH MP 300 is a high-precision wafer testing and metrology equipment designed for testing and inspecting wafers during the production or qualification process. It offers automatic loading and unloading of wafers, and is capable of testing up to 50 wafers per hour. RUDOLPH MP300 wafer tester has a user-friendly setup and control system that is programmable for wafer test and metrology parameters. It can measure a wide range of parameters, including electrical parameters such as voltage and current, as well as physical characteristics such as thickness and reflectance. It can also accommodate different wafer types, including semiconductor, photovoltaic, dielectric, and others. MP-300 is equipped with a large-sized, stable platen to ensure a more stable wafer measurement and handling. It also features an integrated carrier stage with motorized Z-translation for accurate wafer placement. The unit also has a vertical reticle holder that can be adjusted to optimize the measurement setup. In addition, MP300 has a fully automated measurement retrieval machine that allows for measurements to be stored and transferred to a computer or data logger. The tool has a dual-axis measurement scanner with a maximum resolution of 1 nanometer, allowing for precision metrology. Plus, the measurement window can be shifted along both axes to accommodate various wafers. MP 300 is designed to be accurate, reliable, and easy to use. It offers a range of features to make wafer testing and metrology fast and efficient. The asset is compatible with a variety of software packages, such as RUDOLPH Wafer Software Suite. It can integrate with a wide range of other laboratory equipment, and it is powered by a multi-functional PC-based model tough enough to handle its tasks.
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