Used RUDOLPH MP 300 #9392797 for sale

RUDOLPH MP 300 is a high-end wafer testing and metrology equipment designed for use in the semiconductor industry. The system uses laser-based metrology tools for precise measurements of wafer parameters, to ensure that the process of manufacturing chips or Integrated Circuits ( ICs) stays on track. The metrology tool includes a wide variety of tasks, such as controlling the alignment of dies on wafers, measuring the dimensions of wafers before and after etching, controlled distortion of resistors or films, length and width of active devices, exact placement of metal lines, and analysis of electrical properties. The unit consists of an optical microscope, a motorized XY stage, a scanning electron microscope (SEM) and a variety of software packages. The microscope offers Macro,Midfield and Micro imaging modes and provides resolution of up to 50 percent below one nanometer. This feature makes the machine ideal for metrology of very small features, such as ultra-fine metal interconnects. The XY stage enables accurate and precise relative positioning of the wafer, while the SEM allows for higher magnification and imaging of internal and transverse features. In addition to its metrology capabilities, the tool also comes with a variety of software packages, including Thermionics, IC testers, Theta and Gauss Meter. These packages provide advanced functions for defect analysis, signal analysis, failure analysis, model parameter comparison, statistical analysis and reporting of test results. The software is designed to be user-friendly, with intuitive graphical user interfaces and easy-to-use wizards that make data acquisition and analysis quite simple. RUDOLPH MP300 is a robust, reliable asset designed for high-volume production requirements. It is suitable for use in a wide variety of chip fabrication processes, from the most advanced to the most basic level requirements. Made by a leader in the industry, the model is backed by a dedicated customer support team and comes with a proven track record of reliability and performance.