Used RUDOLPH MP 300 #9407340 for sale

ID: 9407340
Vintage: 2010
Thin film thickness measurement system 2010 vintage.
RUDOLPH MP 300 is a state-of-the-art wafer testing and metrology equipment designed to be fast, reliable and accurate. This system is capable of performing a wide range of tests including electrical, magnetic, and optical inspection for the ultimate in wafer performance testing. RUDOLPH MP300 utilizes automated wafer handling and probing technology to ensure that the best possible testing results possible. MP-300 features two load ports, two workstations, and two prober bases. The two load ports allow the unit to be configured for any size wafer, and the two workstations make it possible to quickly run multiple tests on a single wafer. The two prober bases allow for simultaneous testing of up to four wafers simultaneously. MP300 also utilizes automated focus and exposure settings to guarantee precise testing results across a wide range of wafer geometries. RUDOLPH MP-300 also features advanced software for optimal wafer testing automation. RUDOLPH Projection Inspection Machine (RPIS) software allows for automatic image capture, image analysis, and editing for precise defect detection. The RPIS can recognize and classify defects up to 1 micron in size, making it ideal for the highest accuracy in today's wafer metrology. MP 300 also includes robust test automation, wafer handling and data analysis capabilities. RUDOLPH Controlled Prober Tool (RCPS) provides fast and reliable wafer handling and probing, while RUDOLPH Data Analysis Asset (RDAS) delivers real-time analysis and graphics. All these features work together to improve accuracy, reduce test time and costs, and ensure the highest quality results. For maximum reliability, RUDOLPH MP 300 utilizes a triple-shielded high-reliability laser head and is certified to meet the toughest industrial standards. RUDOLPH MP300 is also CE and UL compliant, making it suitable for any type of environment. Overall, MP-300 packs a formidable set of features and capabilities, making it an excellent choice for any wafer testing and metrology needs. From ease-of-use, to data visualization capabilities, to reliability, MP300 is sure to deliver superior results every time.
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