Used RUDOLPH MP 300XCU #9389820 for sale

RUDOLPH MP 300XCU is a high-precision wafer testing and metrology equipment designed for fast and accurate performance. This system utilizes a 300mm dual, dual-beam vector imaging CCD microscope with various accessory attachments, enabling it to measure high-resolution features at sub-micron resolution. It provides real-time imaging and measurement capabilities for wafer testing, inspection and metrology applications. RUDOLPH MP 300 XCU is a reliable and efficient machine, capable of delivering superior results and accuracy in a quick turn around time. It includes a broad range of features such as image processing software that enables fast processing of images and image coordinates. It also features multiple-beam flexible illumination technology which allows for high-contrast imaging of wafer features at any angular orientation. MP 300XCU is also equipped with a set of powerful and versatile metrology capabilities that enable it to measure precise wafer features such as line widths, step heights, die-to-die distances, as well as edge positions. The unit includes a comprehensive suite of features such as advanced image thresholding and custom image filters, that can be utilized to quickly isolate and measure miniscule features. MP 300 XCU's software includes features such as a statistical measurement analysis tool, interactive point-and-click measurement, and advanced analysis capabilities. This powerful software is capable of correcting for variations in illumination or feature shape, along with robust error handling tools. RUDOLPH MP 300XCU also includes a versatile sample handling machine designed for wafer loading, unloading, positioning, and alignment. It is equipped with high-precision stages that provide a wide range of motion and allow for precise and flexible positioning. The tool also includes a shipping stage, with shock-absorbing mounting points to ensure transport of samples without damage, as well as high-power vacuum tips. RUDOLPH MP 300 XCU provides a fast and accurate asset for inspection and metrology applications. Its unique combination of features enables fast inspection and high-precision measurements of sub-micron features. This machine is ideal for test and measurement applications that require speed and accuracy.