Used RUDOLPH MP1-300 #293630203 for sale

RUDOLPH MP1-300 is a state-of-the-art wafer testing and metrology system designed specifically for the semiconductor industry. It provides comprehensive wafer analysis, inspection, testing and characterisation capabilities in a single platform. MP1-300 is an automated solution for metrology and wafer measurement. It uses non-destructive techniques to measure a wafer's optical, electrical, mechanical and electrical characteristics, allowing manufacturers to achieve a higher level of quality control and assurance. The system is equipped with a dedicated digital scanning microscope, enabling accurate and fast evaluation of the surface of the wafer. The microscope provides real-time, high-resolution images of the entire wafer surface, enabling defect analysis and identification to be performed with ease. RUDOLPH MP1-300 is also equipped with a motorised probe station which enables electrical properties to be measured. This includes resistivity, capacitance, inductance and resistance. The system also incorporates a focus-tunable lens which allows for the measurement of optical characteristics such as reflectivity and diffraction. One of the key features of MP1-300 is its dedicated software, which provides comprehensive data analysis and management capabilities. It has a user-friendly graphical user interface (GUI) which allows for the manipulation and display of data in a variety of formats. The software also allows for automated calculations, including time dependent data such as mean-square roughness and surface area, thereby allowing for a complete wafer profile measurement to be performed quickly and accurately. RUDOLPH MP1-300 also incorporates a range of additional features and capabilities, including a highly sensitive autofocus feature, advanced light source control, programmable measurement parameters and an integrated calibration process. All these features allow for the accurate and reliable analysis of a wide variety of wafers, making MP1-300 the ideal tool for ensuring the highest levels of quality control and measuremet accuracy.