Used RUDOLPH MP1-300 #9262045 for sale

RUDOLPH MP1-300 Wafer Testing and Metrology Equipment is a fully automated test solution that can quickly and accurately measure wafers of any size or shape. The system is designed to facilitate the efficient and accurate characterization of wafers for a broad range of applications, with automation allowing for significant time savings and an increased level of accuracy. MP1-300 features a modular design, allowing for custom configurations tailored for specific applications. The modularity of the unit allows users to add, remove, or reconfigure components for increased flexibility. The modularity also enables users to take advantage of reduced acquisition costs, as well as decreased maintenance costs, by allowing them to add components only as needed. At the heart of RUDOLPH MP1-300 is a powerful scanning optical microscope (SOM) stage. This allows the wafer to be scanned and measurements to be taken at variable depths and resolutions. The entire machine is well suited to analyzing a variety of wafer types and structures, including buried wafer layers, high aspect ratio structures, and patterned surfaces. The tool is tightly integrated with RUDOLPH newly developed software, which automates the asset for full data collection and analysis. This allows users to quickly and accurately measure wafers and perform data analysis on their data. The software also accounts for fluctuations in ambient air temperature, humidity, and pressure when detecting defects, allowing for an improved detection rate. MP1-300 is accessible and user-friendly, with a software graphical user interface (GUI) that walks users through the setup and calibration process. The GUI also provides access to features such as data collection, multiple configurations, automatic optimization of image size and frame rate, advanced defect review and reporting, and more. Overall, RUDOLPH MP1-300 Wafer Testing and Metrology Model is a powerful and versatile automated testing solution for wafer characterization. The equipment's highly modular design allows for easy custom configurations, while the integrated software allows for easy setup and data analysis. The system is ideally suited to analyzing a variety of wafer types and structures, and offers significant time and cost savings compared to manual testing.