Used RUDOLPH MP1-300 #9311177 for sale

RUDOLPH MP1-300 Wafer Testing and Metrology Equipment provides fully automated and high-throughput wafer testing and metrology. This system is an integrated solution for the implementation of device-level electrical metric measurements, electrical test, and imaging and optical inspection. MP1-300 is designed to meet stringent production requirements for wafer-level evaluation and characterization. It helps to reduce production times, lower costs and improve quality control. The unit supports wafer sizes from 2 inches to 8 inches and covers both unpatterned wafer and patterned wafer testing and measurement. RUDOLPH MP1-300 is equipped with advanced techniques to measure electrical parameters from different types of transistors and electrical devices. It combines high-resolution dc and low frequency ac measurements with probing at multiple current levels to identify and characterize electronic components. The machine measures voltage, current, time, power, and other device-level metrics with precision. MP1-300 offers integrated optical inspection capability that utilizes CCD cameras to capture high resolution images of the wafer. It is designed to detect defects including etch, contamination, moisture, particles, and other common defects that cause process problems. RUDOLPH MP1-300 is supported by easy-to-use software tools that facilitate the setting up and management of wafer tests. The tool also offers integrated data analysis and reporting tools to capture detailed test results and generate reports for further analysis. MP1-300 is designed with a high degree of flexibility and can quickly adapt to changes in wafer design without compromising on testing accuracy. It is ideal for integration in a wide range of production lines and test systems in the semiconductor industry. With its fast data acquisition and throughput, RUDOLPH MP1-300 is a reliable and cost-effective solution for wafer testing and metrology applications.