Used RUDOLPH MP2 #9397717 for sale

RUDOLPH MP2 is an advanced wafer testing and metrology equipment. It provides a simple, fast and accurate way to measure the physical parameters of integrated circuit wafers. This system is capable of measuring wafer mechanical properties with the highest accuracy, taking into account the wafer's properties such as strain, flatness, bow, twist, unit resonance and a variety of electrical parameters. MP2 uses a 4-axis design with a single scan gantry for probing and positioning. The machine components include a vacuum chucking tool, a high-precision stepper motor and sensor-based calibration, a high-bandwidth laser scanning head, an adjustable vacuum plate, and an interchangeable tool mount. It also includes a large, high-resolution touchscreen, a robust setup utility that stores installations and calibrations, an integrated software suite, and advanced automation control. The vacuum chucking asset allows the wafer to be securely fastened to the vacuum plate while maintaining a low coefficient of friction between the wafer and the vacuum plate. This capacity enables advanced measurement using RUDOLPH MP2's high-bandwidth laser scanning head. The head is capable of measuring the physical parameters of up to 500 die/mm2. The stepper motor and sensor-based calibration model allows for precise positioning for every measurement operation, thus eliminating the need for repeated setup. The adjustable vacuum plate allows for easy adjustment of the measurement position, while the interchangeable tool mount allows for easy connection of additional modules. MP2 equipment also utlizes a robust software suite for an intuitive data acquisition and analysis. Through the automated control options, users are able to imort, analyze, and report wafer test results from numerous different test procedures. RUDOLPH MP2 system provides an efficient and accurate way to measure the physical parameters of integrated circuit wafers, enabling chipmakers to detect potential problems and improve their product yield. It is a powerful wafer testing and metrology tool that is easy to set up, use and maintain.