Used RUDOLPH / ONTO INNOVATION MP3-300XCU #9375220 for sale

RUDOLPH / ONTO INNOVATION MP3-300XCU is a specialized wafer testing and metrology equipment designed to accurately characterize the surface and thickness of semiconductor wafers. It is a laser-based metrology system with advanced optics and 10-nanometer resolution, allowing for precise, non-contact measurements down to the nanometer scale. RUDOLPH MP3-300XCU is equipped with a proprietary 3D metrology algorithm that provides map-like images of a wafer's surface. Its automated scanning process includes a multi-position XY scanning stage to cover the whole wafer surface and a z-axis stage to detect micro-roughness and wafer thickness. The unit's laser-based technology gives it unique advantages, such as detecting fine surface features, measuring ithlinear features accurately, measuring multi-level step heights, and performing height profile measurements of sub-micron features. ONTO INNOVATION MP3-300XCU's software is both user-friendly and sophisticated, enabling users to easily access a wide array of analysis and reporting options. The intuitive interface allows users to configure their measurement parameters in a customizable manner, access a library of stored screen images for comparison or analysis, and rapidly modify their settings on the fly based on the feedback from the real-time metrology measurements. With an integrated tracking machine, users can easily monitor metrology processing activities in real-time. Utilizing MP3-300XCU results in numerous advantages. The tool offers a more cost-effective and less time-consuming approach to characterizing wafers, and the non-contact approach eliminates the risk of damage to delicate wafer surfaces. The advanced metrology also facilitates improved product quality by catching and analyzing subtle differences in the wafers, improving yield and performance. With its high-end 3D laser-based metrology capabilities, RUDOLPH / ONTO INNOVATION MP3-300XCU is an ideal asset for accurately measuring semiconductor wafers. Its superior optical resolution, user-friendly software, and comprehensive tracking capabilities make it the optimal tool for comprehensive wafer testing and metrology.