Used RUDOLPH S3000 #9389592 for sale

RUDOLPH S3000 Wafer Testing and Metrology Equipment is a high-end automated solution designed for testing and metrology applications in the semiconductor and optoelectronics industries. S3000 system offers a platform with a seamless integration of software and hardware for fast and accurate testing, metrology and analysis. The software is capable of managing, analyzing and presenting data for inline and automated production testing and metrology applications with the highest throughputs. RUDOLPH S3000 unit features a multi-axis, high throughput probing machine. The tool can be customized to accommodate a variety of wafer probing applications including probing electrostatic discharge (ESD), electrical measurements, micro-stress engineering, stress testing and probing measurements on semiconductor wafers. The asset also comes with an easy to configure, fully integrated software application that enables users to quickly program measurement protocols. S3000 model is coupled with a Swiss-made precision linear actuator that provides accurate, low-noise, low-vibration probing motion in the X, Y and Z axes. This provides better probing accuracy and repeatability. The equipment also features a higher resolution 3-axis sensitive tactile probe head, designed for high-precision measurements. The position-controlled linear actuator allows the system to traverse the wafer with accurately defined distance steps at any angle and orientation while the optical encoder ensures accurate non-contact scanning across the wafer surface. The unit is equipped with advanced imaging, measurement and analysis tools for cross sectional wafer measurement applications on a variety of substrate materials. It features an extensive library of metrology and analysis algorithms for mapping, inspecting, imaging and calibrating process and product geometry on all types of semiconductor wafers. RUDOLPH S3000 machine supports both standard and custom designed probe cards and modules as well as wafer adapters and flatbed cells. It is also capable of being easily integrated with other leading desktop metrology systems such as the Carl Zeiss MMS 5500. This ensures quick implementation and seamless alignment of data. S3000 tool is highly customizable, with a range of software and hardware components which can be chosen to meet the requirements of a number of different projects. This level of flexibility makes RUDOLPH S3000 ideal for a variety of applications, such as testing wafers for electrical properties, stress, and other characteristics, metrology analysis, and monitoring of production processes.