Used RUDOLPH WS 2500 #9241213 for sale

RUDOLPH WS 2500 Wafer Testing and Metrology Equipment is an image-based, automated optical inspection and analysis system designed for testing and analyzing mid-submicron semiconductor wafers. The unit uses advanced optics to accurately measure wafer surfaces, defects, and other characteristics such as roughness, surface topology, breakdown points, grain size, semiconductor resistivity, uniformity, and more. WS 2500 is a highly automated machine, and the inspection process can be set up with predefined parameters and automated reporting. The inspection is designed to minimize downtime and eliminate manual testing and analysis. It features fast, accurate analysis, up to 50 times faster than manual analysis. RUDOLPH WS 2500 includes precise optics and sensors that provide users with clean and accurate imaging, and a user-friendly interface for set up and operation. The tool has a 590nm laser diode that can accurately measure wafer thickness, and a 660nm laser diode for non-contact surface analysis. It also features a range of inspection mode settings and optional accessories to fit any wafer testing requirement. WS 2500 is equipped with a powerful imaging software for visualizing and analyzing wafer features. The software includes a range of analysis tools such as edge detection, curvature, image recognition, and robust algorithms optimized for metrology of submicrometer features. It also includes advanced statistical tools for measuring critical features, monitor trends, and ensuring accurate test results. RUDOLPH WS 2500 also offers comprehensive reporting tools and options. The asset can be integrated with automation tools for testing high volume wafers, and the user interface allows easy program set-up, control, and data analysis. It is a reliable, cost-effective solution for mid-submicron semiconductor wafer testing and analysis.