Used RUDOLPH WS 3840 #9136132 for sale

RUDOLPH WS 3840 is a wafer testing and metrology equipment designed for semiconductor device companies. It is an automated system to integrate and analyze metrology data from multiple measurement devices. The unit consists of a series of high-performance workstations connected to a central server, each processing and storing metrology data from a single measurement device. It is capable of processing multiple types of metrology data, including wafer area, pitch, die size, and die placement. The machine is highly accurate and repeatable, capable of detecting and analyzing changes in device structure quickly. It also features advanced 2D imaging functions to analyze defect counts and wafer features such as protrusions and die count. The tool also includes a host of other features, including easy-to-operate and intuitive software that allows users to quickly set up and access analysis data. It also features a parameter driven asset that allows customization of analysis data, output formats and user preferences. To ensure accuracy, the model utilizes pattern recognition to detect and analyze small variations in design. This includes adaptive optics which can adjust focus or provide improved illumination through an array of lenses. The equipment is built with a robust design, allowing for high levels of reliability and durability. It also provides advanced scalability, allowing users to easily perform large-scale metrology tasks. Finally, the system offers high levels of security, allowing for remote access and operations. It is compliant with several industry standards and comes with comprehensive support services, including installation, training and maintenance. In conclusion, RUDOLPH WS3840 is an advanced wafer testing and metrology unit designed to meet the needs of semiconductor device companies. It provides users with a range of features and capabilities, allowing for accurate and efficient metrology testing.