Used RUDOLPH WS 3880 #293701811 for sale

RUDOLPH WS 3880 is a wafer testing and metrology equipment designed to measure precise dimensions for a wide range of materials with high accuracy. The system offers a variety of measurement solutions including high resolution optical microscopy, integrated stylus metrology, and digital video metrology for more complex measurements. With a powerful optical unit, RUDOLPH WS3880 is able to resolve submicron level features with consistent accuracy. The machine provides automated image acquisition, measurement and analysis, allowing users to expedite their own unique measurement needs. It features a dual stage table that allows for a wide range of samples to be measured accurately, including thin wafers up to 30 mm thick. Its intuitive user interface makes it easy to customize, configure, and operate the tool to quickly and easily identify the desired measurements. The asset comes equipped with a high resolution imaging model which includes a variety of optical components including a 16x microscope with 1x to 10x magnification levels and an optional CCD camera. This highly configurable setup is able to provide high level image resolution through a well-controlled imaging equipment. The optional CCD camera enables users to capture still images and videos and can also be used to measure high speed motion or rapidly changing features. The system offers a variety of metrology options, including stylus, optical and video metrologies. The stylus metrology enables users to perform fine measurements down to 0.1 um with high repeatability and resolution limits. The optical metrology unit uses a laser interferometer for the highest accuracy and precision total measurements and a digital video microscope for measuring even the most intricate features. In addition to the standard features of the machine, it is also expandable to meet users' changing requirements with optional accessories. This includes a range of sensors and probes for additional metrology capabilities such as active vibration isolation and PVD force sensor. Features such as the Job Manager allow users to develop and save custom measurement plans for recurrent tasks. Its automated stage calibration ensures that the stage is always properly positioned for reliable and repeatable results. WS 3880 is a reliable and versatile tool suitable for monitoring and metrology in semiconductor production and research laboratories. Its high accuracy, repeatability, and 50 um pointing precision make it an ideal solution for wafer testing and metrology.