Used SDI SPV 1050 #9038081 for sale

SDI SPV 1050 is a high-performance wafer testing and metrology equipment designed for a wide variety of applications, ranging from wafer-level characterization to die-level device measurements. The system is powered by SDI innovative Focus Detection and Real-Time (FDR) acquisition technology, which enables the acquisition of optical images in less than two microseconds without any image blurring or distortion. SPV 1050 features a large working area of over 200mm (8 inches) on a single wafer structure, enabling the testing and characterization of full die images. The unit can be configured with an array of optical components, including Gratings, lenses and color CCD cameras, to provide the flexibility and performance necessary for today's demanding metrology applications. The FDR imaging machine is designed with extremely low noise levels for excellent repeatability and high sensitivity for measurement accuracy. It is also equipped with a 400nm Color-Coded Brightness Control (CCBC) to enhance Image Quality Index (QI) for improved accuracy. The tool also features a state-of-the-art Active Pixel Sensor (APS) for high-speed imaging, along with a capacity to take up to 8 megapixel images in a single acquisition. In addition to providing excellent wafer testing and characterization performance, SDI SPV 1050 is also built to withstand high-temperature environments and harsh contaminants - making it the perfect choice for semiconductor manufacturing, laser, factory automation, and other similar environments. SPV 1050 also offers a scalable service package for all levels of user requirements, from on-site help and support to the most comprehensive maintenance and performance assurance plans. The asset also offers standardized methods for part traceability, data analysis and reporting, tool qualification and calibration, metrology verification, process control, and failure analysis. For wafer processing, SDI SPV 1050 offers a High Performance Adaptive Process Platform (HPAP) that enables the user to quickly define and execute a variety of automation tasks, including the ability to monitor, control, and fine-tune process parameters without the need for manual intervention. With help from the HPAP, users can achieve shorter cycle times and higher process yields.