Used SEMCON 1500 #293664306 for sale
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SEMCON 1500 is a next-generation wafer testing and metrology equipment that has been designed to provide comprehensive wafer inspections, measurements, and testing capabilities. This system is equipped with a powerful, multi-axis unit for accurate and repeatable measurements. It features an enhanced imaging machine with advanced imaging capabilities, including high-resolution optical, x-ray, and focused-ion-beam (FIB) imaging. 1500's wafer testing capabilities consist of a variety of specialized tests which are designed to assess any physical and chemical characteristics of a sample, such as electrical function, micro-structural features, chemical composition, and surface chemical properties. This wafer testing and metrology tool is powered by proprietary software with user-defined analysis and reporting tools. It also includes an integrated wafer handling asset for precise control and wafer positioning. SEMCON 1500's metrology capabilities include accurate measurements of features on wafer surfaces, which are then used for quality control and process improvement. This model is capable of providing fast and accurate non-contact 3D measurements, as well as providing quantitative surface analysis. Its metrology capabilities include the ability to access optical and photomicrography information from large-area wafers. 1500 also offers advanced automation and data integration capabilities. It can be integrated with a variety of third-party automation tools and is also capable of creating and running customized scripts for customized testing needs. In addition, this equipment offers powerful data collection, integration, and storage features, which offer users the ability to track and analyze data more efficiently. This system offers a number of unique features that set it apart from other wafer testing and metrology systems. Its advanced imaging capabilities enable users to analyze and inspect intricate wafer structures. Its metrology capabilities offer precise and repeatable measurements. Its automation and data integration capabilities make it capable of customizing tests and data collection. All these features combine to offer an advanced wafer testing and metrology unit that provides reliable and accurate results.
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