Used SEMV TASV-01020-VER1 #9406833 for sale

SEMV TASV-01020-VER1 is a wafer testing and metrology equipment. It is a fully automated stand-alone system, consisting of a stage, optics, and software to measure various features on a silicon wafer including thickness, reflectivity, surface flatness, material and electrical properties. The unit offers advanced imaging capabilities such as high-resolution microscopy and SEM imaging, as well as a number of other innovative features and software. The stage of TASV-01020-VER1 supports a range of wafer sizes and materials. It can be equipped with a lift stage, an XY/Rθ precision stage, and a rotation stage for measuring aspect ratio, flatness, and x-y position. A choice of objective lenses is available and a variety of detectors can be connected to detect signals from the wafer and interpret them for analysis. The optical machine is designed to provide high-precision imaging and measurements. A CCD camera allows for the capture of still images and video, enabling the user to analyze the sample in detail. The tool also comes with a wide range of software applications, making it easier to interpret the data and improve accuracy of results. The software contains various features to manage and analyze the sample data. It includes error detection, waveform analysis, pattern recognition, and statistical analyses. The software also makes it possible to monitor the wafer asset, view trends, and predict future performance. SEMV TASV-01020-VER1 is a cost-effective wafer testing and metrology model that ensures accurate and efficient data analysis. It is ideal for use in research and industrial applications, allowing the user to quickly obtain reliable data in various sample sizes and microstructures. With its advanced features, flexible performance and easy-to-use software, TASV-01020-VER1 is a powerful choice for any metrology needs.