Used SHIBAURA AutoEL-IV #293616278 for sale

SHIBAURA AutoEL-IV is a highly advanced wafer testing and metrology equipment designed to meet the exacting requirements of the semiconductor industry. The system is comprised of a full suite of technologies and processes that allow for comprehensive analysis and testing of a variety of wafer substrates. At the core of AutoEL-IV is its integrated CCD imaging unit. This utilizes a unique combination of proprietary image capture, processing and analysis software in order to collect and analyze data related to defectmetry, particle count and uniformity measurements. Through high-magnification lens systems and sophisticated analysis algorithms, the machine provides complete coverage of all wafer surfaces, as well as a full range of manual and automated image-processing capabilities. In addition to its imaging capabilities, SHIBAURA AutoEL-IV also offers an advanced metrology suite. This includes a variety of optical- and mechanical-based sensors, as well as contactless measurement devices for the accurate detection of physical characteristics at the micro- and nano-scale. Combined with high-speed imaging instruments, this allows for extremely precise data collection and analysis for a wide range of applications. AutoEL-IV also provides a platform for scribing and thinning wafers. This is achieved by specialized equipment which can be used to dice and thin wafers using a combination of laser, heat, and mechanical excision techniques. This ensures that wafers are prepared in such a way that they meet all of the required specifications and can be accurately analyzed by the tool's various metrology and imaging instruments. Lastly, SHIBAURA AutoEL-IV is designed to be highly configurable to match the needs of any given application. With its modular design, users can easily customize the asset to incorporate various additional technologies such as automated vision inspection, film thickness and flatness measurements, defect classification, and particle size analysis. All-in-all, AutoEL-IV is a high-performance wafer testing and metrology model that offers users an extremely powerful and comprehensive platform for the analysis and testing of semiconductor wafers. With its advanced integrated imaging and metrology systems, combined with a range of additional customization options, the equipment is designed to provide users with the precise data required to ensure the success of their semiconductor manufacturing operations.