Used SHIBAURA AutoEL-Ⅲ #293616277 for sale

SHIBAURA AutoEL-Ⅲ is a state-of-the-art wafer testing and metrology equipment that offers high throughput and accuracy. This system is capable of inspecting a wide range of wafer widths and thicknesses in various environments. The main features of this unit include high visual resolution, multi-site sampling, high throughput, low maintenance, and a full range of metrology and testing options. The machine features a die-to-die inspection tool that allows for real-time wafer-level testing and metrology. This asset uses up to four lasers for a variety of measurements including thickness, height, and width. It also features a series of sensors for aligning and focusing on the wafer, as well as for detecting defects and capturing critical features. In addition, the model offers wafer indexing, accuracies down to 20nm, and real-time wafer-level testing and metrology. AutoEL-Ⅲ also has a number of automated features that make it easy to use and maintain. This includes the "Auto-gui" software package, which simplifies programming and interactivity, as well as an automated alignment equipment that allows for multiple test runs on the same wafer. Additionally, the system has an auto-feed and ejection feature, as well as various alignment and measurement functions. The unit also offers a variety of on-screen data monitoring options, allowing users to compare and analyze test results on the fly. A host of reports can also be produced, including wafer maps, fault summaries, and wafer basic results. The machine also offers a USB port for linking the tool to a PC or other host device. SHIBAURA AutoEL-Ⅲ is the perfect solution for high-volume wafer testing and metrology. Its combination of speed, accuracy, and flexibility makes it the ideal tool for high throughput, multi-site sampling, and real-time wafer-level testing and metrology. Additionally, the asset offers low maintenance and an intuitive user interface, making it a great choice for any wafer testing and metrology application.