Used SIGMA KOKI SGSP26-150 #9358498 for sale

SIGMA KOKI SGSP26-150 is an innovative wafer testing and metrology equipment, designed to provide accurate, detailed, and repeatable measurements on thin wafers and thin wafer structures in a streamlined, automated way. SGSP26-150 features a 1.50 meter long bench-top type XY stage with a 90 cm working area designed for use with wafers up to 300 mm in diameter. It can accurately measure a wide range of 0.15 mm to 30 mm thin wafers - providing accurate details of the wafer's cross section. SIGMA KOKI SGSP26-150 also features an integrated Auto Focus function as well as an LED lighting system, which provides high intensity light source capable of measuring sample profile without compromising the accuracy of the results. The unit is capable of capturing up to 2000 images per minute, and can measure a maximum sample size of 3 m. SGSP26-150 is equipped with a variety of measurement functions for advanced 2D and 3D metrology. It supports automatic measurement mode and provides various types of user-defined measurements for various wafer parameters such as surface roughness, material thickness, profile, and 2D/3D tomography. Additionally, the included analysis software features an easy to use Graphical User Interface (GUI), with which users can quickly analyze and interpret their results. The machine is equipped with a powerful evaluation function for calculation and display of various parameters such as pattern size, surface roughness, pattern shape, material thickness, and many more. Additionally, excellent data management tool allows for an efficient data storage and retrieval. For advanced users, SIGMA KOKI SGSP26-150 also provides powerful functions for analysis via advanced algorithms. SGSP26-150 is an effective solution for any industry requiring accurate, precise, and repeatable measurements on thin wafers and wafer structures. Providing both intuitive user operation and high-performance metrology functions, this asset is ideal for meeting the needs of a wide range of wafer testing and metrology applications.