Used SIGNATONE / LUCAS LABS 302 #9397382 for sale

SIGNATONE / LUCAS LABS 302 Wafer Testing and Metrology Equipment provides accurate analysis of semiconductor wafers through performance, testing and metrology scanning. By utilizing non-contact laser scanning, SIGNATONE 302 system evaluates wafers quickly and efficiently in the production of semiconductor devices and materials. LUCAS LABS 302 Wafer Testing and Metrology Unit includes a controller, scanning head, and camera to provide real-time feedback of the results. This allows for rapid scanning of high aspect ratio structures with uniform resolution, providing accurate and reliable measurements for nanometer-scale features. The machine's high-power laser accurately scans panel dimensions, preconditioned surfaces, and electrical parameters, making it ideal for pore inspection and instant in-line metrology applications. Data gathered by 302 is analyzed using advanced algorithms and the results are displayed in real-time. The high resolution images and surface analysis are used to measure positional and dimensional accuracy, allowing for fast and efficient wafer evaluation. Once the evaluation is complete, the images can be saved and archived for further comparisons and analysis. SIGNATONE / LUCAS LABS 302 can also be used to detect and locate particles, microbiological and chemical contaminants, and small defects on silicon wafers. With its non-linear surface measurement and precision die defect detection, the tool is capable of detecting even the smallest of defects. The asset's automated 3D reconstruction algorithms provide detailed defect information such as contours, surfaces, and textures. SIGNATONE 302 Wafer Testing and Metrology Model offers reliability and accuracy in testing, resulting in improved yields and cost savings for customers. The equipment's fast scanning and imaging speeds are enabled by advanced technology, such as the use of multiple laser wavelengths, optical fibers, and customizable software. Furthermore, the system is designed to maximize production efficiency, making it ideal for testing and metrology needs.