Used SIGNATONE Pro4-4000 #162002 for sale

SIGNATONE Pro4-4000 is a full-featured wafer testing and metrology equipment designed to meet the stringent requirements of semiconductor companies who require the utmost accuracy and precision in their testing and metrology. Pro4-4000 offers dual-sided Non-Contact Measure technology (NCM), which provides specimens with a surface area of up to 140mm in diameter, allowing for rapid and accurate wafer testing and evaluation. This ensures that a critical process for semiconductor production is accurate and repeatable. SIGNATONE Pro4-4000 also offers a variety of probes that can accommodate various types of wafer testing, including 1/4-inch, 12-micron, 10-micron and 8-micron probes. These probes can accurately measure properties such as flatness, parallelism and thickness. Pro4-4000 can also measure electrical characteristics of a wafer, including capacitance, dielectric strength, leakage, and current leakage. SIGNATONE Pro4-4000 also offers robust data collection and analysis tools that allow for continuous viewing and analysis of wafer testing and metrology results. This allows for more accurate decisions and faster feedback during the product design cycle. Pro4-4000 is also equipped with software that allows for automated testing sequences, allowing for even greater accuracy and repeatability. The system also has multiple software packages that allow for a variety of other functions, such as feature detection, layer thickness measurement, critical dimension analysis, and rapid analysis of wafer structure. Finally, SIGNATONE Pro4-4000 is equipped with a remote access capability, which allows for remote access and control of the unit. This makes it easier for companies to monitor production processes and manage wafer testing and metrology activities remotely and securely. Overall, Pro4-4000 is an invaluable tool for semiconductor companies who require the utmost accuracy and precision in their testing and metrology activities. It is a highly advanced machine with a variety of probes and software packages that allow for rapid and accurate wafer testing and metrology. The tool also features robust data collection and analysis tools, as well as remote access capabilities, making it ideal for managing production lines and monitoring processes remotely.