Used SII NANOTECHNOLOGY / SEIKO XV-300DB #293614932 for sale

SII NANOTECHNOLOGY / SEIKO XV-300DB Wafer Testing and Metrology Equipment is a powerful tool designed to measure, analyze and compare different kinds of materials in a fast and accurate way. SEIKO XV-300DB features a sophisticated optical metrology system incorporating advanced white light interferometry (WLI) and multiple image processing algorithms. This unit is capable of high resolution imaging and measuring of the 3D optical properties of semiconductor wafers, wafer substrates and other thin films. The machine has a comprehensive measurement suite that includes features such as optical thickness, surface roughness, optical crystalline and dielectric properties. It also provides analysis of defect patterns and failure mechanisms as well as detailed dimensional analysis with 3D, X-Y, and X-Y-Z data. The tool offers a wide range of capabilities for wafer testing and metrology, including litho-etch layer inspection, through defect, overlay and SRAM analysis, as well as particle inspection. SII NANOTECHNOLOGY XV-300DB also supports nanoscale pattern measurement and imaging, with a scanning stage accuracy of 0.1 nanometers. XV-300DB also offers advanced software to enable fast and accurate measurements, data analysis and workflow automation. Its user-friendly Easy Mode programs greatly reduce the learning curve, making this asset perfect for any user regardless of their technical experience. The user-programmable Expert Mode allows for custom operation settings, enabling users to tailor their measurements to their specific application needs. The software also includes an integrated defect library for wafer and defect data management, as well as advanced analysis functions for defect analysis and maintenance. SII NANOTECHNOLOGY / SEIKO XV-300DB features a built-in camera for accurate imaging and positioning of substrates, as well as manual adjustment of precision alignment. The model also has an ergonomic design for easy and convenient operation. Furthermore, SEIKO XV-300DB is compatible with many accessories, including wide-field lenses, index glass, fluorescence contributions, and many more. These features make SII NANOTECHNOLOGY XV-300DB an essential multi-functional-metrology tool for many different industries. To ensure that each unit of the equipment is operating at its optimum performance level, XV-300DB is equipped with remote assistance technology, allowing for online support and upgrades. Additionally, the system is serviced at a certified SEIKO Customer Support center, providing comprehensive maintenance and repair services. SII NANOTECHNOLOGY / SEIKO XV-300DB Wafer Testing and Metrology Unit is a great tool for any company needing to perform accurate, reliable and cost-effective testing and metrology of thin films, semiconductors and other materials. With its advanced analysis features and powerful hardware, SEIKO XV-300DB is the ideal choice for today's high tech applications.